Elektronika Dasar Field Effect Transistor
3.Field-Effect Transistor (FET)
Junction Field-Effect Transistor (JFET)
n-channel JFET
VGS = 0 V and VDS positive value
When VGS=0V and C some positive value,the upper region of the p-type material will be reverse biased higher than the
lower region(the greater the reverse bias,the wider the depletion region).
As the voltage VDS is increased from 0 to a few volts,the current will increase as determined by Ohm’s law and The
depletion region will widen,causing a noticeable reduction in channel widht.If V DS is increased to a level where it appears
that the two depletion regions would “touch”, a condition referred to as pinch-off will result.The level of V DS that
establishes this condition is referred to as pinch-off voltage Vp (when VGS=0V and VDS>Vp IDSS).
8
Input resistance
10 >Ω
VGS < 0V
Shockley’s Equation:
Voltage-Controlled Resistor:
where ro is the resistance with VGS _ 0 V and rd the resistance at a particular level of VGS.
Power dissipation:
p-channel JFET
PD = |VD|ID
Metal-Oxide-Semiconductor Field-Effect Transistor (MOSFET) Or Insulated-Gate FET (IGFET)
Depletio-Type MOSFET (D-MOSFET) n-channel D-MOSFET
When VGS=0V,the drain current is IDSS.
The negative potential at the gate will tend to pressure electrons toward the p-type substrate and attract holes
from the p-type substrate.The drain current is therefore reduce with increasing negative bias for VGS.
The positive potential at the gate will draw additional electrons (free carrier) from the p-type substrate due to
the reverse leakage current,reveals that the drain current will increase.
10
Input resistance > 10 Ω
p-channel D-MOSFET
Enhachement-Type MOSFET (E-MOSFET)
n-channel E-MOSFET
If VGS = 0V,the absence of an n-channel will result in a
current of effectively zero amperes.
VD(ON)
VT
VGS(ON)
p-channel E-MOSFET
VGS
Complementary MOSFET (CMOS)
A very effective logic circuit can be established by contructing a p-channel and an n-channel MOSFET on the
same substrate.
FET Biasing
For de analysis,the coupling capacitors are open cicuits.
Fixed-Bias Configuration
Graphical Approach:
Self-Bias Configuration
Graphical Approach:
=-ID (1K
)
Voltage-Divinder Biasing
Graphical Approach:
Depletion-Type MOSFET
Graphical Approach:
Enhancement-Type MOSFET
Graphical Approach:
V GS =V DS =V DD −I D R D=12 V −I D (2K Ω)
I D=0→V GS =12V
V GS =0→ I D =6 mA
I DQ =2.75 mA
V GS =V DS =6. 4V
Q
p-channel FET
Graphical Approach:
→V GS=V G +I D R S =−4 . 55 V +I D (1 .8 K Ω)
I D=0 →V GS =−4 . 55 V
V GS =0 →I D=2 .53 mA
FET Small-Signal Model
I D=I DSS
(
gm= y fs=
V GS
1−
VP
2
)
ΔI D
2I
V
V
|V DS =const= DSS 1− GS =g mo 1− GS
ΔV GS
|V P|
VP
VP
(
At VGS Q =- 0.5V ® g m =
) (
)
DI D
2 mA
=
=3.3mS
DVGS 0.6V
DI D
1.8mA
=
= 2 .4 mS
DVGS 0 .75V
DI
1.5mA
=- 2.5V ® g m = D =
=1.4 mS
DVGS
1.1V
At VGS Q =- 1.5V ® g m =
AtVGS Q
D
ID
ID
VGS
FET ac equivalent model:
Output resistance:
rd=
Input Impedance of the FET:
Z i ( FET )=∞
(the typical values: JFET
9
12
15
¿ 10 Ω, MOSFET ≃10 −10 Ω)
Output impedance of the FET:
Z o ( FET )=r d =
1
y os
ΔV Ds
ΔI D
=
7V
=14 k Ω
0 . 5 mA
FET Small-Signal Analysis
Common-Source Circuit
+VDD
FET ac equivalent model:
Output resistance:
+VDD
Vi = 0
Zo = RD ||rd
RD
C2
R1
C1
R2
Rs
Cs
Z i =R1||R2
V o =−( gm V gs )( R D||r d )=−( gm V i )( R D||r d )→ A v=
Vo
Vi
=−g m( R D||r d )
+VDD
RD
rd=∞
s
RG
V gs=V i−gmV gs Ralignl ¿ ¿¿
Rs
V gR
¿→V i=V gs(1+gm Rs )¿V o=−(gm V gs)RD ¿Av= o =− m D ¿¿
V i 1+gm Rs
r d ≠∞
D
Vi
Vo
Vo - Vs
rd
Io
V gs=V i −I o Rs
V −V s
−I R −I R
I o =gm V gs + o
=g m V gs+ o D o s
rd
rd
−I R −I R
¿ g m(V i −I o Rs )+ o D o s
rd
gm V i
→I o =
( R D + R s)
1+ g m Rs +
rd
g R V
V o =−I o R D =− m D i
( R +R )
1+ gm Rs + D s
rd
Vo
gm R D
→ A v = =−
Vi
( R D + Rs )
1+ gm R s +
rd
Common-Drain (Source-Follower) Circuit
V o =gm V gs ( R S||r d )=gm ( V i−V o )( R S ||r d )→ A v=
Vo
g ( R ||r )
= m S d
V i 2+ g ( R S||r d )
m
G
S
Z i =RG
1
V i=0→Z o =R S||r d||
gm
Common-Gate Circuit
V o =−( gm V gs ) R D=−gm (−V i ) R D → A V =
1
Z i =RS ||
gm
V i=0→Z o =R D||r d
Enhancemen MOSFET Amplifier
Vo
Vi
=gm R D
k=
I D (ON )
(VGS ( ON ) - VTh ) 2
2
(typically 0.3 mA/V )
V i −V o
−g m V i )(R D||r d )
RG
Vo (1−gm R G )( R D||r d )
→ AV= =
Vi RG +R D||r d
V o =( I 1−g m V gs )(R D||r d )=(
gm R G >> 1)
RG >> R D or r d
(for
g m RG ( R D||r d )
=−g m ( RG||R D||r d )
R G+ RD||r d
¿−g m (R D||r d )
¿−
V i (1−
Vo
)
Vi
V i −V o
V R
R
R
=
→ Zi = i = G
= G
= G
RG
RG
I i 1− AV 1−(−g m (R D||r d )) 1+g m (R D||r d ))
V i=0→R D||r d||RG ≃R D||r d
Ii =
System Approach-Effects of RS and RL
(for
Bypassed Source Resistance
AV =
Unbypassed Source Resistance
Source Follower
Vo
= - g m ( R L || R D )
Vi
Common Gate
V
AV = o =gm(RL || RD )
Vi
Junction Field-Effect Transistor (JFET)
n-channel JFET
VGS = 0 V and VDS positive value
When VGS=0V and C some positive value,the upper region of the p-type material will be reverse biased higher than the
lower region(the greater the reverse bias,the wider the depletion region).
As the voltage VDS is increased from 0 to a few volts,the current will increase as determined by Ohm’s law and The
depletion region will widen,causing a noticeable reduction in channel widht.If V DS is increased to a level where it appears
that the two depletion regions would “touch”, a condition referred to as pinch-off will result.The level of V DS that
establishes this condition is referred to as pinch-off voltage Vp (when VGS=0V and VDS>Vp IDSS).
8
Input resistance
10 >Ω
VGS < 0V
Shockley’s Equation:
Voltage-Controlled Resistor:
where ro is the resistance with VGS _ 0 V and rd the resistance at a particular level of VGS.
Power dissipation:
p-channel JFET
PD = |VD|ID
Metal-Oxide-Semiconductor Field-Effect Transistor (MOSFET) Or Insulated-Gate FET (IGFET)
Depletio-Type MOSFET (D-MOSFET) n-channel D-MOSFET
When VGS=0V,the drain current is IDSS.
The negative potential at the gate will tend to pressure electrons toward the p-type substrate and attract holes
from the p-type substrate.The drain current is therefore reduce with increasing negative bias for VGS.
The positive potential at the gate will draw additional electrons (free carrier) from the p-type substrate due to
the reverse leakage current,reveals that the drain current will increase.
10
Input resistance > 10 Ω
p-channel D-MOSFET
Enhachement-Type MOSFET (E-MOSFET)
n-channel E-MOSFET
If VGS = 0V,the absence of an n-channel will result in a
current of effectively zero amperes.
VD(ON)
VT
VGS(ON)
p-channel E-MOSFET
VGS
Complementary MOSFET (CMOS)
A very effective logic circuit can be established by contructing a p-channel and an n-channel MOSFET on the
same substrate.
FET Biasing
For de analysis,the coupling capacitors are open cicuits.
Fixed-Bias Configuration
Graphical Approach:
Self-Bias Configuration
Graphical Approach:
=-ID (1K
)
Voltage-Divinder Biasing
Graphical Approach:
Depletion-Type MOSFET
Graphical Approach:
Enhancement-Type MOSFET
Graphical Approach:
V GS =V DS =V DD −I D R D=12 V −I D (2K Ω)
I D=0→V GS =12V
V GS =0→ I D =6 mA
I DQ =2.75 mA
V GS =V DS =6. 4V
Q
p-channel FET
Graphical Approach:
→V GS=V G +I D R S =−4 . 55 V +I D (1 .8 K Ω)
I D=0 →V GS =−4 . 55 V
V GS =0 →I D=2 .53 mA
FET Small-Signal Model
I D=I DSS
(
gm= y fs=
V GS
1−
VP
2
)
ΔI D
2I
V
V
|V DS =const= DSS 1− GS =g mo 1− GS
ΔV GS
|V P|
VP
VP
(
At VGS Q =- 0.5V ® g m =
) (
)
DI D
2 mA
=
=3.3mS
DVGS 0.6V
DI D
1.8mA
=
= 2 .4 mS
DVGS 0 .75V
DI
1.5mA
=- 2.5V ® g m = D =
=1.4 mS
DVGS
1.1V
At VGS Q =- 1.5V ® g m =
AtVGS Q
D
ID
ID
VGS
FET ac equivalent model:
Output resistance:
rd=
Input Impedance of the FET:
Z i ( FET )=∞
(the typical values: JFET
9
12
15
¿ 10 Ω, MOSFET ≃10 −10 Ω)
Output impedance of the FET:
Z o ( FET )=r d =
1
y os
ΔV Ds
ΔI D
=
7V
=14 k Ω
0 . 5 mA
FET Small-Signal Analysis
Common-Source Circuit
+VDD
FET ac equivalent model:
Output resistance:
+VDD
Vi = 0
Zo = RD ||rd
RD
C2
R1
C1
R2
Rs
Cs
Z i =R1||R2
V o =−( gm V gs )( R D||r d )=−( gm V i )( R D||r d )→ A v=
Vo
Vi
=−g m( R D||r d )
+VDD
RD
rd=∞
s
RG
V gs=V i−gmV gs Ralignl ¿ ¿¿
Rs
V gR
¿→V i=V gs(1+gm Rs )¿V o=−(gm V gs)RD ¿Av= o =− m D ¿¿
V i 1+gm Rs
r d ≠∞
D
Vi
Vo
Vo - Vs
rd
Io
V gs=V i −I o Rs
V −V s
−I R −I R
I o =gm V gs + o
=g m V gs+ o D o s
rd
rd
−I R −I R
¿ g m(V i −I o Rs )+ o D o s
rd
gm V i
→I o =
( R D + R s)
1+ g m Rs +
rd
g R V
V o =−I o R D =− m D i
( R +R )
1+ gm Rs + D s
rd
Vo
gm R D
→ A v = =−
Vi
( R D + Rs )
1+ gm R s +
rd
Common-Drain (Source-Follower) Circuit
V o =gm V gs ( R S||r d )=gm ( V i−V o )( R S ||r d )→ A v=
Vo
g ( R ||r )
= m S d
V i 2+ g ( R S||r d )
m
G
S
Z i =RG
1
V i=0→Z o =R S||r d||
gm
Common-Gate Circuit
V o =−( gm V gs ) R D=−gm (−V i ) R D → A V =
1
Z i =RS ||
gm
V i=0→Z o =R D||r d
Enhancemen MOSFET Amplifier
Vo
Vi
=gm R D
k=
I D (ON )
(VGS ( ON ) - VTh ) 2
2
(typically 0.3 mA/V )
V i −V o
−g m V i )(R D||r d )
RG
Vo (1−gm R G )( R D||r d )
→ AV= =
Vi RG +R D||r d
V o =( I 1−g m V gs )(R D||r d )=(
gm R G >> 1)
RG >> R D or r d
(for
g m RG ( R D||r d )
=−g m ( RG||R D||r d )
R G+ RD||r d
¿−g m (R D||r d )
¿−
V i (1−
Vo
)
Vi
V i −V o
V R
R
R
=
→ Zi = i = G
= G
= G
RG
RG
I i 1− AV 1−(−g m (R D||r d )) 1+g m (R D||r d ))
V i=0→R D||r d||RG ≃R D||r d
Ii =
System Approach-Effects of RS and RL
(for
Bypassed Source Resistance
AV =
Unbypassed Source Resistance
Source Follower
Vo
= - g m ( R L || R D )
Vi
Common Gate
V
AV = o =gm(RL || RD )
Vi