Sunlin keynote IDF Berlin 043003

Silicon Integration
for Convergence
Sunlin Chou
Senior Vice President
General Manager
Technology and Manufacturing Group
April 2003

1

Silicon Integration for Convergence:
Three Strategic Combinations
y Computing + Communications
y CMOS Base + Application Specific Modules
y Silicon Technology Base + Nanotechnology

2

Silicon Integration for Convergence:
Three Strategic Combinations
y Computing + Communications

y CMOS Base + Application Specific Modules
y Silicon Technology Base + Nanotechnology

3

Computing + Communications Vision:
Data Anytime, Anywhere
Cellular: Voice + Data

@ the Office
Everywhere
Else

10/100/GbE
802.11b/a

@ Hotspots
@ Home
802.11b/a


Broadband
10/100

4

802.11b/a
Cellular

Silicon is the Engine

Converged
Computing and
Communications
Microprocessors

Drive convergence
with silicon integration
Memory
5


Silicon Scaling and Integration
Improve Performance, Power, Cost
Relative scale (log)

Scaling effects on transistors
1
Delay
Swi
C os t
tchi
ng e
ner
gy

0.1
0.01
0.001

1993 1995 1997 1999 2001 2003 2005
.5µm


.35µm

.25µm .18µm .13µm

Silicon scaling
Source: Intel

6

90nm

65nm

Cell Phones For Voice + Data
Mb

Flash Memory Density Growth in Japan

200

160

44K COLOR
RICH JAVA APPS.
MP3
PHOTOS

120
80
40
0

1998

VOICE ONLY

1999

PACKETIZED DATA


2000

256 COLOR

2001

4K COLOR
JAVA APPS.

Convergence increases silicon usage
Source: NEC, Intel

7

2002

Converged Cell Phone
Integration Opportunities
Communications


Computing

Memory

Signal
Signal
Radio
Processing
Radio(RF)
(RF) Processing
Rx
Rx
Tx
Tx
PA
PA

DSP
DSP
Core

Core

CPU
CPU

Display
Display
Peripherals
Peripherals

Analog
Analog
Baseband
Baseband

CMOS (Digital, Analog)
GaAs/SiGe (for RF)

USB
USB


Power
Power
Mgmt.
Mgmt.

Flash
Flash
SRAM
SRAM

Bluetooth
Bluetooth

CMOS (Digital)

8

CMOS (Memory)


Integration via Packaging
Under Research

Ultrathin Stacked
Chip Scale Packaging
2003
8 Die Stack
50 µm Die

>150 M Units
Shipped

4 to 5 Die
1 to 1.2 mm

75 µm Die Thinness

2 to 3 Die
1.2mm
125 - 175 µm Die

Thickness
2 Die
1.4mm Package Height
9

Wireless Internet on a Chip
by Flash+Logic Integration
Intel®
MicroSignal
Architecture

Logic

90nm

S
R
A
M

Flash

Power mgmt
& peripherals

90nm Transistor Gate
on 0.13µm Process

0.16µm2 Flash Cell
Cell
phone
stds.

PXA800F Cellular Processor

Integration improves density,
speed, power consumption
Source: Intel

10

Silicon Integration for Convergence:
Three Strategic Combinations
y Computing + Communications
y CMOS Base + Application Specific Modules
y Silicon Technology Base + Nanotechnology

11

Intel’s Technologies for Convergence:
CMOS Base + Apps-Specific Modules
Logic
Logic
CMOS
CMOSBase
Base

Processor
Flash
FlashMemory
Memory

Memory

Flash
Flash++Logic
Logic
++Analog
Analog

Integrated PCA
(Cellular)

Mixed
MixedSignal
Signal

Ethernet/WiFi

High
High
Frequency
Frequency
Logic
Logic

Optical

Economy of scale (shared base)
+ application
-specific optimization
application-specific
12

Process Modules Available for
Ethernet/WiFi and Optical Comm
Inductor Spiral

MIM Capacitor/Resistor
MIM RES

M7
VIA

MIM CAP

M6

M6 BOTTOM PLATE

SiGe BJT

EMITTER

Poly Si Resistor

CMOS

POLY Si
D

SiGe
BASE

S
STI

COLLECTOR
13

10Gb/s SONET Transceiver
on 90nm Technology
TX

RX

Output @ 10.66Gb/s

Single chip CMOS
Precision passives
(R, L, C)
Source: Intel

14

802.11 (WiFi) Integration
Improves Cost and Power
Today

90nm

Digital Functions
MAC

Baseband

Analog Functions
RF Radio

Analog
Front End

15

Radio Research at Intel
Intelligent
Intelligent
Roaming
Roaming
Silicon
Silicon
Radio
Radio

Smart
SmartAntenna
Antenna
Systems
Systems

Dynamically
Dynamically
Reconfigurable
Reconfigurable

MEMS
MEMS
Components
Components

MEMS: Micro Electro Mechanical Systems
16

MEMS Antenna Switches and Filters
for Multi Band Radios
Antenna
Receive

MEMS Antenna Switch
Transmit
MEMS Filters

MEMS benefits: Low insertion loss
+ component integration
17

Integrated MEMS RF Switches
Drain
Source

Gate

Switch design

Multiple gold RF switches integrated
into one silicon MEMS chip

Fabricated using
silicon processing technology
Source: Intel

18

MEMS Integrated with CMOS
MEMS
Varactor

MEMS Varactor
flip chip bonded
to a CMOS VCO

Source: Intel

19

Silicon Integration for Convergence:
Three Strategic Combinations
y Computing + Communications
y CMOS Base + Application Specific Modules
y Silicon Technology Base + Nanotechnology

20

Silicon Devices Shrink to Virus Size..

50nm

100nm

Influenza virus

Transistor for
90nm Process

Source: CDC

Source: Intel

..and Nanotechnology Scale
21

Intel in Production with
Nanotechnology (< 100nm)
10000

10

Nominal feature size
1000

1
130nm
90nm

Micron

Nanometer

Gate Length

100

0.1

Nanotechnology

70nm
50nm
10

0.01

1970

1980
Source: Intel

1990

2000
22

2010

2020

Lithography is the Designer’s “Brush”

Lithography is indispensable for
defining locations/configurations
of circuit elements/functions
23

Lithography Gap to Close with EUVL
(Extreme Ultra Violet Lithography)
1000
nm

Feature size
248nm

100

193nm

Gap

Lithography
Wavelength

157nm

13nm (EUVL)

10
’89 ’91 ’93 ’95 ’97 ’99 ’01 ’03 ’05 ’07 ’09 ’11
Initial Production
Source: Intel

24

EUV LLC Consortium Demonstrates
EUVL with Prototype Exposure Tool

Source: Sandia

25

Full Field Images Produced by
EUV Prototype Exposure Tool

80nm elbows 1:1
200mm wafer

24 x 32.5mm2 field
100nm contacts 1:1

Commercial EUVL exposure tool
feasibility demonstrated
Source: Sandia

26

EUV Masks Simpler to Pattern and
Inspect than Optical Masks
EUV Mask

Optical Mask

(45nm Process)

(45nm Process)

Est. Cost/Layer:
< $90K

Est. Cost/layer:
$100K (OPC Only)
$150K (OPC + Comp)

EUVL masks will cost less than
optical lithography masks
27

EUVL Being Developed and
Commercialized Worldwide
Japan

Europe

> 10 Companies
Consortia:
• ASET
• EUVA
• MIRAI

> 50 Companies
Consortia:
• PREUVE
• MEDEA+
• LETI
• IMEC

US
> 40 Companies
Consortia:
• EUV LLC
• I-SEMATECH
• VNL RDC
• SRC
28

Intel’s Transistor Research in
Deep Nanotechnology Space
Experimental transistors for future process generations

30nm

20nm

65nm process
2005 production

15nm
45nm process
2007 production

32nm process
2009 production

Transistors will be improved
for production
Source: Intel

29

10nm

22nm process
2011 production

Intel’s Transistors Run Fast on
90nm Strained Silicon Process

Current Flow
Normal
electron
flow

Faster
electron
flow

Normal Silicon Lattice

Strained Silicon Lattice

A new way to speed up
with nanotechnology
Source: Intel

30

Transistors Improved by Going 3-D
Intel’s experimental Tri-gate transistor
raises performance, lowers off current
Gate
Gate
Drain
Drain
Source

Source

Silicon

New nanotechnology
device options coming
Source: Intel

31

Future Nanotechnology will Ride
on Silicon Technology Base
Silicon
Nanowire*

Carbon
Nanotube
Nanotube/Nanowire
Transistors

Molecular
Electronics
Nanodevices

Silicon
Technology
Base

Innovations expected to overcome scaling limits
*Source: Morales & Lieber, Harvard Univ 32

Nanotechnology Brings
Welcomed Opportunities
y Renewal and extension of silicon technology
– New materials, processes and device structures
– Integrate innovations into silicon technology base
– Break limits of “static” silicon scaling model

y Intel plans to lead in nanotechnology
– Already in production with nanotechnology
– Heavily engaged in nanotechnology R&D
– Best positioned to use nanotechnology innovations

33

Video
Nanotechnology extends Silicon Technology
Dr. R. Stanley Williams
HPL Fellow, Director, Quantum Science Research
Hewlett-Packard Labs
Professor Yoshio Nishi
Professor Electrical Engineering
Director, Stanford Nano Fabrication Facility

34

Silicon Integration for Convergence:
Three Strategic Combinations
y Computing + Communications
– Use silicon scaling and integration to improve
performance, energy efficiency, cost

y CMOS Base + Application Specific Modules
– Shared CMOS base for economy of scale
– Process modules optimized for each application

y Silicon Technology Base + Nanotechnology
– Nanotechnology innovations will ride on silicon
– Intel leading nanotechnology production, R&D

35