Pembuatan Nanosilikon Dari Pasir Alam Secara Magnesiotermik Dengan Penambahan Kalium Klorida

LAMPIRAN

Universitas Sumatera Utara

62

Lampiran 1. Data JCPDS Silikat (Morris,1976)

Universitas Sumatera Utara

63

Lampiran 2. Data JCPDS Silikon (Morris,1976)

Universitas Sumatera Utara

64

Lampiran 3. Difraktogram Silika Hasil Pemurnian dari Pasir Kuarsa
tion


Analysis date

2016/03/28 11:23:32

Sample name

Spl SiO2

Measurement date

2016/03/28 11:11:14

File name

171-xrd-2016.ras

Operator

administrator


Comment

Universitas Sumatera Utara

65

Lampiran 4. Puncak Difraktogram Silika Hasil Pemurnian dari Pasir Kuarsa
No.

2-theta(deg)

d(ang.)

Height(counts
)

FWHM(deg)

Int. I(counts
deg)


Int. W(deg)

Asym
.
factor

1
2
3
4
5
6
7
8
9
10
11
12
13

14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33

34
35
36
37
38
39
40
41
42
43
44
45
46
47
48
49
50
51
52


5.71(5)
13.442(13)
20.733(15)
22.482(7)
23.340(4)
23.434(4)
24.123(13)
24.327(12)
26.249(13)
26.415(6)
26.538(2)
26.937(5)
27.336(10)
27.463(7)
27.592(6)
27.801(14)
30.134(19)
30.479(7)
30.829(2)
35.03(4)

36.339(9)
36.906(15)
39.223(4)
40.070(17)
41.325(8)
41.993(15)
42.51(4)
45.33(2)
45.693(7)
47.88(6)
49.560(6)
50.001(3)
52.403(13)
54.704(18)
57.815(13)
58.163(13)
59.840(4)
60.531(17)
61.858(15)
65.39(4)

67.587(12)
67.939(4)
69.367(8)
72.708(13)
73.324(8)
73.457(8)
74.625(5)
78.638(8)
79.66(3)
81.16(10)
83.645(10)
87.206(6)

15.46(13)
6.582(7)
4.281(3)
3.9515(11)
3.8082(6)
3.7931(6)
3.6863(19)

3.6558(18)
3.3923(17)
3.3715(7)
3.3561(3)
3.3072(6)
3.2598(12)
3.2451(8)
3.2302(7)
3.2064(15)
2.9633(18)
2.9305(7)
2.8981(2)
2.559(3)
2.4703(6)
2.4336(10)
2.2950(2)
2.2484(9)
2.1830(4)
2.1498(7)
2.1247(19)

1.9991(9)
1.9839(3)
1.898(2)
1.8378(2)
1.82265(12)
1.7446(4)
1.6765(5)
1.5935(3)
1.5848(3)
1.54433(10)
1.5283(4)
1.4987(3)
1.4261(8)
1.3849(2)
1.37860(7)
1.35366(14)
1.2995(2)
1.29008(13)
1.28806(12)
1.27078(8)

1.21567(11)
1.2027(4)
1.1841(12)
1.15517(11)
1.11692(6)

42(7)
73(9)
185(14)
425(21)
65(8)
393(20)
111(11)
285(17)
197(14)
229(15)
676(26)
395(20)
104(10)
228(15)
413(20)
145(12)
20(4)
174(13)
125(11)
14(4)
117(11)
27(5)
107(10)
55(7)
102(10)
58(8)
39(6)
43(7)
334(18)
10(3)
44(7)
834(29)
55(7)
71(8)
50(7)
54(7)
184(14)
34(6)
43(7)
10(3)
54(7)
455(21)
107(10)
70(8)
256(16)
169(13)
361(19)
47(7)
29(5)
12(3)
56(7)
30(5)

0.74(15)
0.11(4)
0.13(3)
0.099(5)
0.042(18)
0.063(5)
0.09(3)
0.110(16)
0.321(15)
0.063(8)
0.060(3)
0.100(5)
0.128(15)
0.09(6)
0.09(3)
0.157(13)
0.22(6)
0.121(10)
0.055(4)
0.67(11)
0.110(10)
0.075(18)
0.119(12)
0.13(3)
0.069(9)
0.168(18)
0.40(4)
0.10(3)
0.083(7)
0.53(16)
0.09(2)
0.104(3)
0.07(2)
0.117(18)
0.102(11)
0.106(11)
0.083(7)
0.13(2)
0.20(3)
0.71(13)
0.122(14)
0.093(4)
0.114(7)
0.115(12)
0.135(17)
0.113(13)
0.107(5)
0.069(12)
0.18(3)
0.37(9)
0.133(15)
0.11(2)

42(7)
15.9(16)
45(2)
46.4(15)
4.1(16)
36(2)
11(3)
37(4)
72(4)
17(2)
50(3)
47.3(13)
17(2)
24(21)
45(24)
26.9(16)
6.4(12)
26.7(11)
9.5(4)
12.0(17)
15.7(8)
2.6(6)
15.6(10)
11.2(9)
10.2(7)
10.7(9)
17.1(13)
5.6(11)
36.0(18)
6(2)
4.8(9)
110(2)
6.4(7)
12.1(9)
5.5(5)
6.2(6)
25.4(9)
7.1(8)
11.3(9)
7.6(16)
8.8(8)
57.5(13)
14.1(7)
9.3(8)
40(4)
22(4)
52.1(13)
4.2(6)
7.1(8)
4.6(10)
9.5(7)
3.6(6)

1.0(3)
0.22(5)
0.24(3)
0.109(9)
0.06(3)
0.091(10)
0.10(4)
0.13(2)
0.36(5)
0.075(15)
0.073(7)
0.120(9)
0.16(4)
0.11(10)
0.11(6)
0.19(3)
0.31(13)
0.154(18)
0.076(10)
0.9(4)
0.134(19)
0.10(4)
0.15(2)
0.20(4)
0.100(16)
0.18(4)
0.43(10)
0.13(4)
0.108(11)
0.6(4)
0.11(4)
0.132(7)
0.11(3)
0.17(3)
0.11(3)
0.12(3)
0.138(15)
0.21(6)
0.26(6)
0.8(4)
0.16(4)
0.126(9)
0.132(19)
0.13(3)
0.16(3)
0.13(4)
0.144(11)
0.09(3)
0.25(7)
0.4(2)
0.17(4)
0.12(4)

0.6(7)
0.4(3)
1.0(5)
0.8(2)
3(12)
1.3(3)
0.4(3)
1.4(7)
0.30(
6)
0.9(3)
1.28(
19)
1.05(
19)
3.5(1
5)
0.4(4)
1.4(8)
0.7(2)
0.6(7)
1.9(6)
0.82(
13)
1.2(1
0)
0.9(3)
1.3(1
1)
0.3(3)
0.9(5)
1.1(6)
4(2)
2.0(9)
1.1(1
1)
1.4(7)
0.9(1
4)
0.2(2)
1.22(
18)
1.0(9)
1.0(8)
1.9(1
0)
1.2(6)
1.0(2)
1.2(6)
2.2(8)
5(7)
1.8(7)
1.4(2)
1.0(3)
1.1(5)
1.0(4)
0.6(3)
0.89(
18)
2.1(1
1)
0.4(5)
1.6(1
6)
1.0(3)
0.3(4)

Peak

Universitas Sumatera Utara

66

Lampiran 5. Difraktogram Nanosilikon Hasil Pemurnian Metode Pertama

Analysis date

2016/08/31 10:46:15

Sample name

Si-KCl (S)

Measurement date

2016/08/31 10:35:51

File name

625-XRD-2016.ras

Operator

administrator

Comment

Measurement profile

Measurement Profile
Measurement Profile

Meas. data:625-XRD-2016/Data 1
BG data:625-XRD-2016/Data 1
Calc. data:625-XRD-2016/Data 1

15000

Intensity (cps)

10000

5000

0
20

40

60

2-theta (deg)

Peak List
No.

2theta(deg)

d(ang.)

Height(cps
)

FWHM(de
g)

Int. I(cps
deg)

Int. W(deg)

Asym.
factor

1

20.578(10)

4.313(2)

1465(110)

0.060(12)

126(11)

0.086(14)

1.5(15)

2

26.388(7)

3.3748(9)

3726(176)

0.110(14)

681(22)

0.183(15)

1.6(5)

3

28.192(5)

3.1628(5)

2715(27)

0.250(9)

1.50(14)

36.59(3)

2.4540(18)

10871(301
)857(85)

0.199(3)

4

0.20(3)

250(11)

0.29(4)

1.3(8)

5

44.53(2)

2.0330(10)

540(67)

0.18(3)

136(9)

0.25(5)

0.8(5)

6

47.057(6)

1.9296(2)

6257(228)

0.199(5)

1523(18)

0.243(12)

1.34(15)

7

55.867(6)

3561(172)

0.183(7)

862(13)

0.242(15)

1.13(15)

8

59.10(4)

1.64437(16
)1.5620(11)

284(49)

0.26(6)

104(12)

0.36(10)

1.5(13)

9

64.981(19)

1.4340(4)

605(71)

0.16(2)

160(8)

0.26(4)

1.4(8)

10

67.36(3)

1.3890(5)

307(51)

0.16(4)

76(8)

0.25(7)

0.7(6)

11

68.889(11)

0.165(11)

266(9)

0.23(3)

1.1(4)

76.146(8)

1.36188(19
)1.24913(11

1161(98)

12

1719(120)

0.180(8)

417(10)

0.24(2)

1.3(3)

)

Universitas Sumatera Utara

67

Lampiran 6. Hasil Analisa Kuantitatif Nanosilikon Hasil Pemurnian Metode
PertamaGeneral information

Analysis date

2016/09/21 13:35:26

Sample name

Si-KCl (S)

Measurement date

File name

625-XRD-2016.asc

Operator

2016/08/31 10:44:00

Comment

Qualitative analysis results

Phase name

Formul
a

Figure of
merit

Phase reg. detail

DB card number

Silicon

Si

0.493

User (COD)

9013108

Quartz low

Si O2

1.955

01-070-2540

Silicon
Oxide
Quartz, syn

Si O2

1.101

Si O2

1.165

ICDD (PDF-2/Release
2012 RDB)
ICDD (PDF-2/Release
2012 RDB)
ICDD (PDF-2/Release
2012 RDB)

01-075-3165
01-088-2487

Weight ratio

625-XRD-2016

100
90

Phase name

Content(%)

-

Silicon

40.4(4)

-

Quartz low

38(2)

-

Silicon Oxide

6.7(3)

-

Quartz, syn

15.4(4)

80
70
60
50
40
30
20
10
0

625-XRD-2016

Silicon(%)
Quartz low(%)
Silicon Oxide(%)
Quartz, syn(%)

Measurement profile
Meas. data:625-XRD-2016/Data 1

15000

Intensity (cps)

10000

5000

0
Silicon
Quartz low
Silicon Oxide
Quartz, syn

20

40

60

2-theta (deg)

Universitas Sumatera Utara

68

Lampiran 7. Difraktogram Nanosilikon Hasil Pemurnian Metode Kedua

General information

Analysis date

2016/09/30 10:08:57

Sample name

Si KCl (dJ )

Measurement date

2016/09/30 09:29:21

File name

690-xrd-2016.ras

Operator

Administrator

Comment

Measurement profile

40000

Meas. data:690-xrd-2016/Data 1
BG data:690-xrd-2016/Data 1
Calc. data:690-xrd-2016/Data 1

30000

Intensity (cps)

20000

10000

0
20

40

60

2-theta (deg)

Peak list

No.

2theta(deg)

d(ang.)

Height(cps)

FWHM(deg
)

Int. I(cps
deg)

Int. W(deg)

Asym.
Factor

1

28.386(5)

3.1416(5)

24765(454)

0.212(4)

6243(69)

0.252(7)

4.4(7)

2

36.678(15)

2.4482(10)

493(64)

0.24(2)

177(10)

0.36(7)

0.59(12)

3

42.297(6)

2.1351(3)

873(85)

0.070(9)

88(5)

0.101(16)

0.4(2)

4

44.67(5)

2.027(2)

283(49)

0.27(7)

116(9)

0.41(10)

1.0(9)

5

47.186(5)

15127(355)

0.188(4)

3609(34)

0.239(8)

1.53(15)

6

56.013(4)

1.92459(17
)1.64042(11

8513(266)

0.199(4)

2091(21)

0.246(10)

1.56(13)

7

59.18(4)

)
1.5601(9)

194(40)

0.27(5)

71(8)

0.37(12)

0.5(4)

8

65.159(13)

1.4305(3)

387(57)

0.24(2)

120(7)

0.31(6)

3.1(8)

9

69.001(8)

0.201(9)

510(11)

0.26(2)

1.18(19)

76.235(5)

1.35995(13
)1.24790(7)

1980(128)

10

3486(170)

0.168(5)

786(12)

0.225(15)

1.10(16)

Universitas Sumatera Utara

69

Lampiran 8. Hasil Analisa Kuantitatif Nanosilikon Hasil Pemurnian Metode Kedua
neral information
Analysis date

2016/10/10 11:47:04

Sample name

Si KCl (dJ )

Measurement date

File name

690-xrd-2016.asc

Operator

2016/09/30 09:39:00

Comment

Qualitative analysis results
Phase name

Formul
a

Figure of
merit

Phase reg. Detail

DB card
number

Silicon
Silicon Oxide
Quartz alpha, alphaSi
O2
Stishovite
Quartz low

Si
Si O2
Si O2
Si O2
Si O2

0.156
1.281
1.335
3.673
1.867

User (COD)
ICDD (PDF2/Release
2012 RDB)
ICDD (PDF2/Release
2012 RDB)
ICDD (PDF2/Release
2012 RDB)
ICDD
(PDF2/Release 2012 RDB)

9013104
01-075-3165
01-089-8937
01-072-2310
01-070-2540

Weight ratio
70
65

690-xrd-2016

60
55
50
45
40

Content(%)
64.7(6)
3.0(3)
1.7(3)
9(2)
22(4)

35
30
25
20
15
10
5
0

690-xrd-2016

Silicon(%)
Silicon Oxide(%)
Quartz a...Si O2(%)
Stishovite(%)
Quartz low(%)

Measurement profile
40000

Meas. data:690-xrd-2016/Data 1

30000

20000
Intensity (cps)

-

Phase name
Silicon
Silicon Oxide
Quartz alpha, alpha-Si O2
Stishovite
Quartz low

10000

0
Silicon
Silicon Oxide
Quartz alpha, alpha-Si O2
Stishovite
Quartz low

20

30

40

50

60

70

2-theta (deg)

Universitas Sumatera Utara