Michael Garner Sept.16, 2003 Michael Garner Sept.16, 2003 Michael Garner Sept.16, 2003 Michael Garner Sept.16, 2003 Michael Garner Sept.16, 2003 Michael Garner Sept.16, 2003

18 18 C. Michael Garner Sept.16, 2003 C. Michael Garner Sept.16, 2003 Characterization Techniques Characterization Techniques Characterization Techniques Quantitative Understanding Physics-based Computer Vision Scientific measurements Model Knowledge • • Interpret images in conjunction with physical models Interpret images in conjunction with physical models Î Î Focus on nanoscale sources such as AFMs, STMs, FIB Focus on nanoscale sources such as AFMs, STMs, FIB • • New metrology is needed…… New metrology is needed…… Î Î Faster structural analysis Faster structural analysis Î Î Nano Nano - - composition analysis composition analysis Î Î Monitor chemical reactions Monitor chemical reactions 19 19 C. Michael Garner Sept.16, 2003 C. Michael Garner Sept.16, 2003 Beyond the roadmap…. Beyond the roadmap…. • • Many device options…. Many device options…. • • Compatibility with CMOS for evolutionary Compatibility with CMOS for evolutionary introduction introduction • • Directed or self assembly of arrays??? Directed or self assembly of arrays??? Î Î Defect density or purity required…. Defect density or purity required…. • • Self correcting architectures?? Self correcting architectures?? • Nanotechnology needs a richer suite of functionality… Collaboration between Industry, Universities, and Government is essential Collaboration between Industry, Universities, Collaboration between Industry, Universities, and Government is essential and Government is essential 20 20 C. Michael Garner Sept.16, 2003 C. Michael Garner Sept.16, 2003 What are we looking for? What are we looking for? • • Required characteristics: Required characteristics: Î Î Scalability Scalability Î Î Performance Performance Î Î Energy efficiency Energy efficiency Î Î Gain Gain Î Î Operational reliability Operational reliability Î Î Room temp. operation Room temp. operation • • Preferred approach: Preferred approach: Î Î CMOS process CMOS process compatibility compatibility Î Î CMOS architectural CMOS architectural compatibility Alternative state variables Alternative state variables • • Spin Spin – – electron, nuclear, electron, nuclear, photon photon • • Phase Phase • • Quantum state Quantum state • • Magnetic flux quanta Magnetic flux quanta • • Mechanical deformation Mechanical deformation • • Dipole orientation Dipole orientation • • Molecular state Molecular state compatibility 21 21 C. Michael Garner Sept.16, 2003 C. Michael Garner Sept.16, 2003