Michael Garner Sept.16, 2003 Michael Garner Sept.16, 2003 Michael Garner Sept.16, 2003 Michael Garner Sept.16, 2003 Michael Garner Sept.16, 2003 Michael Garner Sept.16, 2003
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C. Michael Garner Sept.16, 2003 C. Michael Garner Sept.16, 2003
Characterization Techniques Characterization Techniques
Characterization Techniques
Quantitative Understanding
Physics-based Computer Vision
Scientific measurements
Model Knowledge
• •
Interpret images in conjunction with physical models Interpret images in conjunction with physical models
Î Î
Focus on nanoscale sources such as AFMs, STMs, FIB Focus on nanoscale sources such as AFMs, STMs, FIB
• •
New metrology is needed…… New metrology is needed……
Î Î
Faster structural analysis Faster structural analysis
Î Î
Nano Nano
- -
composition analysis composition analysis
Î Î
Monitor chemical reactions Monitor chemical reactions
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C. Michael Garner Sept.16, 2003 C. Michael Garner Sept.16, 2003
Beyond the roadmap…. Beyond the roadmap….
• •
Many device options…. Many device options….
• •
Compatibility with CMOS for evolutionary Compatibility with CMOS for evolutionary
introduction introduction
• •
Directed or self assembly of arrays??? Directed or self assembly of arrays???
Î Î
Defect density or purity required…. Defect density or purity required….
• •
Self correcting architectures?? Self correcting architectures??
• Nanotechnology needs a richer suite of functionality…
Collaboration between Industry, Universities, and Government is essential
Collaboration between Industry, Universities, Collaboration between Industry, Universities,
and Government is essential and Government is essential
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C. Michael Garner Sept.16, 2003 C. Michael Garner Sept.16, 2003
What are we looking for? What are we looking for?
• •
Required characteristics: Required characteristics:
Î Î
Scalability Scalability
Î Î
Performance Performance
Î Î
Energy efficiency Energy efficiency
Î Î
Gain Gain
Î Î
Operational reliability Operational reliability
Î Î
Room temp. operation Room temp. operation
• •
Preferred approach: Preferred approach:
Î Î
CMOS process CMOS process
compatibility compatibility
Î Î
CMOS architectural CMOS architectural
compatibility
Alternative state variables Alternative state variables
• •
Spin Spin
– –
electron, nuclear, electron, nuclear,
photon photon
• •
Phase Phase
• •
Quantum state Quantum state
• •
Magnetic flux quanta Magnetic flux quanta
• •
Mechanical deformation Mechanical deformation
• •
Dipole orientation Dipole orientation
• •
Molecular state Molecular state
compatibility
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C. Michael Garner Sept.16, 2003 C. Michael Garner Sept.16, 2003